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• Nanoscale Characterization Facility
  | name = Nanoscale Characterization Facility | Website = https://www.nano.upenn.edu/resources/nanoscale-characterization/
  3 KB (379 words) - 10:41, 5 November 2024
• Simple Rate Characterization Process
  2 KB (315 words) - 13:42, 13 November 2024

Page text matches

• Dan Sabrsula
  |AreasResponsibility = PVD, Electrical Characterization, Process Development ...lectron-beam evaporation. He also trains and assists users with electrical characterization tools such as probe stations.
  1 KB (143 words) - 15:50, 25 April 2024
• David Jones
  ...fabrication Facility. His main responsibilities are process development & characterization, remote & internal user processing support and training QNF users on QNF eq
  627 bytes (73 words) - 13:52, 29 April 2022
• EDS
  ...' or '''(EDX)''' is an analytical technique allowing for precise elemental characterization of specimens in an electron microscope. Results are collected as spectra an
  2 KB (301 words) - 14:00, 21 June 2024
• Equipment
  == Metrology & characterization == === Electrical characterization ===
  6 KB (810 words) - 13:37, 2 December 2024
• JEOL 7500F HRSEM
  [[Category:Characterization]] ...DAX Energy Dispersive x-ray spectrometer (EDS)]] is available for chemical characterization via spectra or element maps.
  2 KB (277 words) - 14:27, 14 October 2024
• JEOL F200
  [[Category:Characterization]]
  1 KB (152 words) - 11:12, 14 February 2024
• JEOL NEOARM
  [[Category:Characterization]]
  2 KB (247 words) - 11:13, 14 February 2024
• Jandel Multi Height Four Point Probe
  [[Category:Electrical Characterization]] | Instrument_Type = Electrical Characterization
  974 bytes (128 words) - 10:45, 28 June 2024
• Jason A. Röhr
  .... He is responsible for the Physical Vapor Deposition (PVD) and electrical characterization tools within the QNF. Prior to joining Penn, Jason held postdoc positions a
  1 KB (160 words) - 13:52, 24 August 2022
• KLA Tencor P7 2D&3D/stress profilometer
  * Materials characterization for surface roughness and waviness
  1,020 bytes (125 words) - 10:44, 28 June 2024
• KLA Tencor P7 2D profilometer
  * Materials characterization for surface roughness and waviness
  1 KB (152 words) - 10:44, 28 June 2024
• Keyence Profilometer
  [[Category:Characterization]]
  4 KB (491 words) - 13:33, 5 August 2024
• Lesker PVD75 DC/RF Sputterer
  ===== Independent Deposition Rate Characterization ===== * [[Simple Rate Characterization Process | Simple Rate Characterization Process]]
  10 KB (1,464 words) - 10:05, 19 November 2024
• Main Page
  ...and researchers that integrates state-of-the-art nanofabrication and nano characterization equipment to define new frontiers in nanotechnology. The Center boasts expe [[Nanoscale Characterization Facility]]
  2 KB (275 words) - 09:27, 20 September 2023
• Micromanipulator 4060 Probe Station
  [[Category:Electrical Characterization]] | Instrument_Type = Electrical Characterization
  1 KB (171 words) - 15:31, 17 September 2024
• Nanoscale Characterization Facility
  | name = Nanoscale Characterization Facility | Website = https://www.nano.upenn.edu/resources/nanoscale-characterization/
  3 KB (379 words) - 10:41, 5 November 2024
• Probe Station
  * Device characterization
  1 KB (149 words) - 13:28, 3 January 2024
• Process Resources
  = Film Characterization= * [https://upenn.app.box.com/file/1004242723681 Deposition and Etch Characterization of LPCVD SiNx thin films]
  1 KB (216 words) - 14:48, 17 June 2024
• Quattrone Nanofabrication Facility
  ...d chemical vapor deposition, dry and wet processing, metrology, and device characterization. The facility is managed by full-time technical staff and available for use
  3 KB (391 words) - 08:08, 2 August 2024
• SCS PDS2010 Parylene Coater
  * [https://repository.upenn.edu/scn_tooldata/45/ Characterization and Optimization of Parylene-C deposition process using SCS Parylene coater
  1 KB (175 words) - 15:12, 12 March 2024

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