Nanoscale Characterization Facility

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Nanoscale Characterization Facility
NCF Entrance.jpg
A view of the sample prep suite from the NCF lobby
Home Institution University of Pennsylvania
Location Philadelphia, PA
Building Krishna P. Singh Center for Nanotechnology
Established 2013
Director Douglas Yates


The Nanoscale Characterization Facility (NCF) supports state-of-the-art tools for electron- and ion-beam analyses for Penn as well as other university, government, and industry users in the Philadelphia region. The facility comprises a suite of rooms specifically designed to host current and next-generation scanning electron, transmission electron, and focused ion beam microscopes. Supplementing these tools is an integrated sample preparation laboratory with sample coating and plasma cleaning capabilities, as well as cryogenic sample preparation equipment and a computer suite for offline image and data analysis. The NCF is currently maintained by three full-time staff scientists with over 45 years of combined experience in materials characterization.


Go to NEMO: to request training and reserve equipment.

Scanning Electron Microscopy

Focused Ion Beam Microscopy

Transmission Electron Microscopy

Sample Preparation