Keyence Profilometer
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| Tool Name | Keyence |
|---|---|
| Instrument Type | Profilometer |
| Staff Manager | Nicole Bohn, Matt Brukman, Jamie Ford |
| Lab Location | Singh 018 |
| Tool Manufacturer | Keyence |
| Tool Model | Keyence VK-X3100 |
| NEMO Designation | Keyence Profilometer |
| Lab Phone | XXXXX |
| SOP Link | Keyence Operating Guide |
Description
The Keyence VK-X3100 combines laser scanning confocal microscopy with white light/focus variation modes to measure 3D characteristics of surfaces, including roughness, planar dimensions, height, film thickness, and more. The tool includes objective lenses from 5X to 50X, allowing both low and high magnification work on a variety of surfaces.