Jandel Multi Height Four Point Probe
The system allows probing of wafers, ingots, or samples of widely varying dimensions. A locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height. A plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc. The system utilizes a Jandel Cylindrical probe head.
- Material resistivity measurements
SOPs & Troubleshooting
- [NA - staff assisted use only]