Difference between revisions of "Nanoscale Characterization Facility"
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=== [[Scanning Electron Microscopy]] === | === [[Scanning Electron Microscopy]] === | ||
| − | * [[JEOL 7500F HRSEM]] | + | * [[JEOL 7500F HRSEM]] | [https://sites.google.com/seas.upenn.edu/ncf-em-reference/microscopes/7500f/operating-guide 7500F Reference Guide ] |
| − | * [[TFS Quanta 600 FEG ESEM]] | + | * [[TFS Quanta 600 FEG ESEM]] | [https://sites.google.com/seas.upenn.edu/ncf-em-reference/microscopes/quanta/operating-guide Quanta Reference Guide ] |
=== [[Focused Ion Beam Microscopy]] === | === [[Focused Ion Beam Microscopy]] === | ||
| − | * [[TESCAN S8000X FIB/SEM]] | + | * [[TESCAN S8000X FIB/SEM]] | [https://docs.google.com/document/d/1qIlr6CCq-emf9hGmN1KmVK9YRDbW2GvPb3tLOEYPpVU/edit?usp=sharing pFIB SOP] |
=== [[Transmission Electron Microscopy]] === | === [[Transmission Electron Microscopy]] === | ||
| − | * [[JEOL F200]] | + | * [[JEOL F200]] | [https://nemo.nano.upenn.edu/media/tool_documents/f200/JEOL_F200_TEM_Manual_v1.0.pdf F2 SOP: NEMO login required] |
| − | * [[JEOL NEOARM]] | + | * [[JEOL NEOARM]] | [https://nemo.nano.upenn.edu/media/tool_documents/jeol-arm200cf-neoarm-tem/UPenn_NeoARM_Instrument_Procedures_1.0.pdf NEOARM SOP: NEMO login required] |
=== [[Sample Preparation]] === | === [[Sample Preparation]] === | ||
| − | * [[EMS/Quorum Q150T ES Sputter Coater]] | + | * [[EMS/Quorum Q150T ES Sputter Coater]] | [https://docs.google.com/document/d/1ZhtG7VIoWiD9y2cjKl_ZA7sz6mFCP4Uo/edit?usp=sharing&ouid=110872984262115844223&rtpof=true&sd=true Coater SOP] |
* [[Gatan Solarus 950 Advanced Plasma System]] | * [[Gatan Solarus 950 Advanced Plasma System]] | ||
Latest revision as of 10:41, 5 November 2024
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| A view of the sample prep suite from the NCF lobby | |
| Home Institution | University of Pennsylvania |
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| Location | Philadelphia, PA |
| Building | Krishna P. Singh Center for Nanotechnology |
| Established | 2013 |
| Director | Douglas Yates |
| Website | https://www.nano.upenn.edu/resources/nanoscale-characterization/ |
About
The Nanoscale Characterization Facility (NCF) supports state-of-the-art tools for electron- and ion-beam analyses for Penn as well as other university, government, and industry users in the Philadelphia region. The facility comprises a suite of rooms specifically designed to host current and next-generation scanning electron, transmission electron, and focused ion beam microscopes. Supplementing these tools is an integrated sample preparation laboratory with sample coating and plasma cleaning capabilities, as well as cryogenic sample preparation equipment and a computer suite for offline image and data analysis. The NCF is currently maintained by three full-time staff scientists with over 45 years of combined experience in materials characterization.
Equipment
Go to NEMO to request training, reserve equipment, and log in to equipment.