Difference between revisions of "Nanoscale Characterization Facility"

From Quattrone Nanofabrication Facility
Jump to navigation Jump to search
(created page: added photo and about.)
 
(minor modification to description. added list with links to pages to be filled in.)
Line 14: Line 14:
  
 
== About ==
 
== About ==
The '''Nanoscale Characterization Facility (NCF)''' supports state-of-the-art tools for electron- and ion-beam analyses for Penn as well as other university, government, and industry users in the Philadelphia region. The facility comprises a suite of rooms specifically designed to host current and next-generation scanning electron, transmission electron, and focused ion beam microscopes. Supplementing these tools is an integrated sample preparation laboratory with sample coating and plasma cleaning capabilities, as well as cryogenic sample preparation equipment and a computer suite for offline image and data analysis. The NCF is currently maintained by three full-time scientists with combined experience of over 45 years in materials characterization.
+
The '''Nanoscale Characterization Facility (NCF)''' supports state-of-the-art tools for electron- and ion-beam analyses for Penn as well as other university, government, and industry users in the Philadelphia region. The facility comprises a suite of rooms specifically designed to host current and next-generation [[Scanning Electron Microscopy|scanning electron]], [[Transmission Electron Microscopy|transmission electron]], and [[Focused Ion Beam Microscopy|focused ion beam]] microscopes. Supplementing these tools is an integrated sample preparation laboratory with sample coating and plasma cleaning capabilities, as well as cryogenic sample preparation equipment and a computer suite for offline image and data analysis. The NCF is currently maintained by three full-time staff scientists with over 45 years of combined experience in materials characterization.
  
  
Line 20: Line 20:
  
 
== Equipment ==
 
== Equipment ==
* '''[https://nemo.nano.upenn.edu/ Equipment Reservations]:''' Go to the facility's ''NEMO'' site to request training and make reservations to use the equipment
+
''Go to '''[https://nemo.nano.upenn.edu/ NEMO]:''' to request training and reserve equipment.''
 +
 
 +
=== [[Scanning Electron Microscopy]] ===
 +
* [[JEOL 7500F HRSEM]]
 +
* [[TFS Quanta 600 FEG ESEM]]
 +
 
 +
=== [[Focused Ion Beam Microscopy]] ===
 +
* [[TESCAN S8000X FIB/SEM]]
 +
 
 +
=== [[Transmission Electron Microscopy]] ===
 +
* [[JEOL F200]]
 +
* [[JEOL NEOARM]]
 +
 
 +
== Techniques ==
 +
* [[EDS]]
 +
* [[EBSD]]
 +
* [[Low Voltage SEM]]
 +
* [[Low Vacuum SEM]]
 +
* [[ToF-SIMS]]
 +
* [[STEM]]
 +
* [[EELS]]
 +
 
 +
== Theory ==
 +
* [[Sources]]
 +
* [[Lenses]]
 +
* [[Apertures]]
 +
* [[Detectors]]
 +
* [[Sample Preparation]]
 +
* [[External Resources]]

Revision as of 15:36, 12 February 2024


Nanoscale Characterization Facility
NCF Entrance.jpg
A view of the sample prep suite from the NCF lobby
Home Institution University of Pennsylvania
Location Philadelphia, PA
Building Krishna P. Singh Center for Nanotechnology
Established 2013
Director Douglas Yates
Website https://www.nano.upenn.edu/resources/nanoscale-characterization/

About

The Nanoscale Characterization Facility (NCF) supports state-of-the-art tools for electron- and ion-beam analyses for Penn as well as other university, government, and industry users in the Philadelphia region. The facility comprises a suite of rooms specifically designed to host current and next-generation scanning electron, transmission electron, and focused ion beam microscopes. Supplementing these tools is an integrated sample preparation laboratory with sample coating and plasma cleaning capabilities, as well as cryogenic sample preparation equipment and a computer suite for offline image and data analysis. The NCF is currently maintained by three full-time staff scientists with over 45 years of combined experience in materials characterization.



Equipment

Go to NEMO: to request training and reserve equipment.

Scanning Electron Microscopy

Focused Ion Beam Microscopy

Transmission Electron Microscopy

Techniques

Theory