Jandel Multi Height Four Point Probe

From Quattrone Nanofabrication Facility
Revision as of 12:35, 28 July 2025 by Coana (talk | contribs)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
Jump to navigation Jump to search


Jandel Multi Height Four Point Probe
MET-08.jpeg
Tool Name Jandel Multi Height Four Point Probe
Instrument Type Electrical Characterization
Staff Manager Lucas Barreto
Lab Location Bay 4
Tool Manufacturer Jandel
Tool Model Four Point Probe
NEMO Designation MET-08
Nearest Phone XXXXX
SOP Link [ NA]

Description

The system allows probing of wafers, ingots, or samples of widely varying dimensions. A locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height. A plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc. The system utilizes a Jandel Cylindrical probe head.

Applications
  • Material resistivity measurements


Resources

SOPs & Troubleshooting
  • [NA - staff assisted use only]
Retrieved from "https://wiki.nano.upenn.edu/wiki/index.php?title=Jandel_Multi_Height_Four_Point_Probe&oldid=2789"