External Resources

Overview

This page includes useful reference texts and websites. It will be updated periodically. Contact Nicole Bohn if you have any recommendations, requests, or need help finding resources listed below.

General Resources

• MyScope Microscopy Training. Microscopy Australia. myscope.training

Includes pages on most microscopy techniques and simulation environments. Note: the SEM simulator is NOT an exact replica of real conditions in the SEM. It may be helpful for practicing procedures.

Transmission Electron Microscopy

• Williams, David B. and C. Barry Carter. Transmission Electron Microscopy: A Textbook for Materials Science. Springer. (multiple eds.)

An introductory textbook to transmission electron microscopy covers basic theory and more advanced techniques. "The bible" of TEM.

• Williams, David B. and C. Barry Carter (Eds). Transmission Electron Microscopy: Diffraction, Imaging, and Spectroscopy. Springer. (multiple eds.)

A supplemental text to the first Williams and Carter text. Includes specialized topics and supplemental material referenced in the first.

• Rodenburg, John. “Tutorials in Transmission Electron Microscopy.” Last modified October 2004, Rodenburg.org

An independent resource with an easy to follow self-guided "course" on practical TEM with important theory (and minimal math.)

Scanning Electron Microscopy

• Goldstein, Joseph., et al. Scanning Electron Microscopy and Microanalysis. Springer. (multiple eds.)

Standard text for SEM and EDS, includes sections on theory, sample prep, analysis, and imaging techniques.

• Exploring Uncharted Realms with Electron Microscopy. ThermoScientific. https://assets.thermofisher.com/TFS-Assets/MSD/Handbooks/Exploring-uncharted-realms-with-electron-microscopy.pdf

ThermoFisher's intro to SEM

• "Electron Microscopy Learning Center." Thermo Fisher Scientific. https://www.thermofisher.com/us/en/home/electron-microscopy/learning-center.html

A collection of resources from ThermoFisher

• Bohn, Nicole. “NCF EM Reference.” Last modified 2023, NCF EM Reference (our internal reference website, includes SOPs.)

Staff compiled summary of SEM principles, with SOPs, expectations, etc.

Focused Ion Beam Microscopy

• Giannuzzi, Lucille A. and Fred A. Stevie (Eds). Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. Springer, 2005.

An Introduction to FIB

EDS and EBSD

• Goldstein, Joseph., et al. Scanning Electron Microscopy and Microanalysis. Springer.

In the SEM textbook listed above

• “Tips and Tricks.” EDAX.com, 2022. EDAX.com

EDS tips from EDAX (the manufacturer of our EDS systems)

• Introduction to EDS Analysis: Reference Manual. Bruker, 2011.

EDS overview from Bruker. PDF.