External Resources

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Overview

This page includes useful reference texts and websites. It will be updated periodically. Contact Nicole Bohn if you have any recommendations.

Transmission Electron Microscopy

  • Williams, David B. and C. Barry Carter. Transmission Electron Microscopy: A Textbook for Materials Science. Springer. (multiple eds.)
  • Williams, David B. and C. Barry Carter (Eds). Transmission Electron Microscopy: Diffraction, Imaging, and Spectroscopy. Springer. (multiple eds.)
  • Rodenburg, John. “Tutorials in Transmission Electron Microscopy.” Last modified October 2004, Rodenburg.org

Scanning Electron Microscopy

  • Goldstein, Joseph., et al. Scanning Electron Microscopy and Microanalysis. Springer. (multiple eds.)
  • Bohn, Nicole. “NCF EM Reference.” Last modified 2023, NCF EM Reference (our internal reference website, includes SOPs.)

Focused Ion Beam Microscopy

  • Giannuzzi, Lucille A. and Fred A. Stevie (Eds). Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. Springer, 2005.

EDS and EBSD

  • Goldstein, Joseph., et al. Scanning Electron Microscopy and Microanalysis. Springer.
  • “Tips and Tricks.” EDAX.com, 2022. EDAX.com
  • Introduction to EDS Analysis: Reference Manual. Bruker, 2011.
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