Difference between revisions of "Zygo NewView 7300 Optical Profilometer"
m (Changed protection level for "Zygo NewView 7300 Optical Profilometer" ([Edit=Allow only autoconfirmed users] (indefinite) [Move=Allow only autoconfirmed users] (indefinite))) |
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| Tool_Manufacturer = Zygo | | Tool_Manufacturer = Zygo | ||
| Tool_Model = NewView 7300 | | Tool_Model = NewView 7300 | ||
| − | | Iris_Designation = MET- | + | | Iris_Designation = MET-XX |
| Lab_Phone = XXXXX | | Lab_Phone = XXXXX | ||
| SOP Link = [https://www.seas.upenn.edu/~nanosop/Zygo_SOP.htm SOP] | | SOP Link = [https://www.seas.upenn.edu/~nanosop/Zygo_SOP.htm SOP] | ||
}} | }} | ||
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| + | ===Note=== | ||
| + | The Zygo has been replaced with a new WLI tool. Please see the [[Filmetrics_Profilm3D | Profilm3D]] instead. | ||
== Description == | == Description == | ||
| + | |||
The NewView 7300 white light interferometer (profilometer) is a powerful tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 20000 µm at high speeds, independent of surface texture, magnification, or feature height! | The NewView 7300 white light interferometer (profilometer) is a powerful tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 20000 µm at high speeds, independent of surface texture, magnification, or feature height! | ||
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===== SOPs & Troubleshooting ===== | ===== SOPs & Troubleshooting ===== | ||
| − | * [https://www.seas.upenn.edu/~nanosop/Zygo_SOP.htm | + | * [https://www.seas.upenn.edu/~nanosop/Zygo_SOP.htm SOP] |
Latest revision as of 08:17, 17 May 2023
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| Tool Name | Zygo NewView 7300 Optical Profilometer |
|---|---|
| Instrument Type | Metrology |
| Staff Manager | David Barth |
| Lab Location | Bay 2 |
| Tool Manufacturer | Zygo |
| Tool Model | NewView 7300 |
| NEMO Designation | {{{NEMO_Designation}}} |
| Lab Phone | XXXXX |
| SOP Link | SOP |
Note
The Zygo has been replaced with a new WLI tool. Please see the Profilm3D instead.
Description
The NewView 7300 white light interferometer (profilometer) is a powerful tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 20000 µm at high speeds, independent of surface texture, magnification, or feature height!
Using ZYGO’s Coherence Scanning Interferometry (CSI) technology, the NewView™ 7300 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.
Applications
- Step height measurements
- Surface roughness measurements
- 3D maping of surfaces