Difference between revisions of "Woollam V-VASE Ellipsometer"
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(Created page with "Category:Metrology {{EquipmentInfo | name = Woollam V-VASE Ellipsometer | Tool_Name = Woollam V-VASE Ellipsometer | image = 300px | imagecaption =...") |
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| imagecaption = | | imagecaption = | ||
| Instrument_Type = Metrology | | Instrument_Type = Metrology | ||
| − | | Staff_Manager = Eric Johnston | + | | Staff_Manager = [[Eric Johnston | Eric Johnston]] |
| − | | Lab_Location = | + | | Lab_Location = Cleanroom Corridor |
| Tool_Manufacturer = J. A. Woollam Co. | | Tool_Manufacturer = J. A. Woollam Co. | ||
| Tool_Model = V-Vase | | Tool_Model = V-Vase | ||
| − | | | + | | NEMO_Designation = MET-06 |
| Lab_Phone = XXXXX | | Lab_Phone = XXXXX | ||
| SOP Link = [https://www.seas.upenn.edu/~nanosop/VAS_Ellipsometer_SOP.htm SOP] | | SOP Link = [https://www.seas.upenn.edu/~nanosop/VAS_Ellipsometer_SOP.htm SOP] | ||
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===== SOPs & Troubleshooting ===== | ===== SOPs & Troubleshooting ===== | ||
* [https://www.seas.upenn.edu/~nanosop/VAS_Ellipsometer_SOP.htm QNF SOP] | * [https://www.seas.upenn.edu/~nanosop/VAS_Ellipsometer_SOP.htm QNF SOP] | ||
| + | * [https://upenn.box.com/s/2aocua49gws8xsrd11jd1bvrujyyy7sa Finding_Signal-1ReceiverUnit.pdf] | ||
Latest revision as of 15:29, 14 October 2024
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| Tool Name | Woollam V-VASE Ellipsometer |
|---|---|
| Instrument Type | Metrology |
| Staff Manager | Eric Johnston |
| Lab Location | Cleanroom Corridor |
| Tool Manufacturer | J. A. Woollam Co. |
| Tool Model | V-Vase |
| NEMO Designation | MET-06 |
| Lab Phone | XXXXX |
| SOP Link | SOP |
Description
The V-VASE is a Variable Angle Spectroscopic Ellipsometer and features totally automated thin film characterization, high-precision angle, and a wide spectral range (240nm to 1700nm). It has a vertical sample mounting, automated sample mapping, and focused spot size. Some of the key benefits are: highest precision and accuracy of any Spectroscopic Ellipsometer, totally automated angle of incidence, nondestructive materials analysis, easily characterize all types of materials: semiconductors, dielectrics, polymers, metals, multilayers, and more
Applications
- Reflection and Transmission Ellipsometry
- Generalized Ellipsometry
- Reflectance (R) intensity
- Transmittance (T) intensity
- Cross-polarized R/T
- Depolarization
- Scatterometry
- Mueller-matrix