Difference between revisions of "Jandel Multi Height Four Point Probe"
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| − | [[Category: | + | [[Category:Characterization]][[Category:Equipment]] |
{{EquipmentInfo | {{EquipmentInfo | ||
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| imagecaption = | | imagecaption = | ||
| Instrument_Type = Electrical Characterization | | Instrument_Type = Electrical Characterization | ||
| − | | Staff_Manager = [[ | + | | Staff_Manager = [[Lucas Barreto | Lucas Barreto]] |
| Lab_Location = Bay 4 | | Lab_Location = Bay 4 | ||
| Tool_Manufacturer = Jandel | | Tool_Manufacturer = Jandel | ||
Latest revision as of 12:35, 28 July 2025
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| Tool Name | Jandel Multi Height Four Point Probe |
|---|---|
| Instrument Type | Electrical Characterization |
| Staff Manager | Lucas Barreto |
| Lab Location | Bay 4 |
| Tool Manufacturer | Jandel |
| Tool Model | Four Point Probe |
| NEMO Designation | MET-08 |
| Nearest Phone | XXXXX |
| SOP Link | [ NA] |
Description
The system allows probing of wafers, ingots, or samples of widely varying dimensions. A locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height. A plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc. The system utilizes a Jandel Cylindrical probe head.
Applications
- Material resistivity measurements
Resources
SOPs & Troubleshooting
- [NA - staff assisted use only]