Difference between revisions of "Jandel Multi Height Four Point Probe"
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| imagecaption = | | imagecaption = | ||
| Instrument_Type = Electrical Characterization | | Instrument_Type = Electrical Characterization | ||
| − | | Staff_Manager = Sam Azadi | + | | Staff_Manager = [[Sam Azadi | Sam Azadi]] |
| − | | Lab_Location = Bay | + | | Lab_Location = Bay 4 |
| Tool_Manufacturer = Jandel | | Tool_Manufacturer = Jandel | ||
| Tool_Model = Four Point Probe | | Tool_Model = Four Point Probe | ||
| − | | | + | | NEMO_Designation = MET-08 |
| Lab_Phone = XXXXX | | Lab_Phone = XXXXX | ||
| SOP Link = [ NA] | | SOP Link = [ NA] | ||
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===== SOPs & Troubleshooting ===== | ===== SOPs & Troubleshooting ===== | ||
| − | * [ NA] | + | * [NA - staff assisted use only] |
Latest revision as of 10:45, 28 June 2024
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| Tool Name | Jandel Multi Height Four Point Probe |
|---|---|
| Instrument Type | Electrical Characterization |
| Staff Manager | Sam Azadi |
| Lab Location | Bay 4 |
| Tool Manufacturer | Jandel |
| Tool Model | Four Point Probe |
| NEMO Designation | MET-08 |
| Lab Phone | XXXXX |
| SOP Link | [ NA] |
Description
The system allows probing of wafers, ingots, or samples of widely varying dimensions. A locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height. A plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc. The system utilizes a Jandel Cylindrical probe head.
Applications
- Material resistivity measurements
Resources
SOPs & Troubleshooting
- [NA - staff assisted use only]