Difference between revisions of "Nanoscale Characterization Facility"
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== About == | == About == | ||
| − | The '''Nanoscale Characterization Facility (NCF)''' supports state-of-the-art tools for electron- and ion-beam analyses for Penn as well as other university, government, and industry users in the Philadelphia region. The facility comprises a suite of rooms specifically designed to host current and next-generation scanning electron, transmission electron, and focused ion beam microscopes. Supplementing these tools is an integrated sample preparation laboratory with sample coating and plasma cleaning capabilities, as well as cryogenic sample preparation equipment and a computer suite for offline image and data analysis. The NCF is currently maintained by three full-time scientists with | + | The '''Nanoscale Characterization Facility (NCF)''' supports state-of-the-art tools for electron- and ion-beam analyses for Penn as well as other university, government, and industry users in the Philadelphia region. The facility comprises a suite of rooms specifically designed to host current and next-generation [[Scanning Electron Microscopy|scanning electron]], [[Transmission Electron Microscopy|transmission electron]], and [[Focused Ion Beam Microscopy|focused ion beam]] microscopes. Supplementing these tools is an integrated sample preparation laboratory with sample coating and plasma cleaning capabilities, as well as cryogenic sample preparation equipment and a computer suite for offline image and data analysis. The NCF is currently maintained by three full-time staff scientists with over 45 years of combined experience in materials characterization. |
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== Equipment == | == Equipment == | ||
| − | + | ''Go to '''[https://nemo.nano.upenn.edu/ NEMO]:''' to request training and reserve equipment.'' | |
| + | |||
| + | === [[Scanning Electron Microscopy]] === | ||
| + | * [[JEOL 7500F HRSEM]] | ||
| + | * [[TFS Quanta 600 FEG ESEM]] | ||
| + | |||
| + | === [[Focused Ion Beam Microscopy]] === | ||
| + | * [[TESCAN S8000X FIB/SEM]] | ||
| + | |||
| + | === [[Transmission Electron Microscopy]] === | ||
| + | * [[JEOL F200]] | ||
| + | * [[JEOL NEOARM]] | ||
| + | |||
| + | == Techniques == | ||
| + | * [[EDS]] | ||
| + | * [[EBSD]] | ||
| + | * [[Low Voltage SEM]] | ||
| + | * [[Low Vacuum SEM]] | ||
| + | * [[ToF-SIMS]] | ||
| + | * [[STEM]] | ||
| + | * [[EELS]] | ||
| + | |||
| + | == Theory == | ||
| + | * [[Sources]] | ||
| + | * [[Lenses]] | ||
| + | * [[Apertures]] | ||
| + | * [[Detectors]] | ||
| + | * [[Sample Preparation]] | ||
| + | * [[External Resources]] | ||
Revision as of 15:36, 12 February 2024
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| A view of the sample prep suite from the NCF lobby | |
| Home Institution | University of Pennsylvania |
|---|---|
| Location | Philadelphia, PA |
| Building | Krishna P. Singh Center for Nanotechnology |
| Established | 2013 |
| Director | Douglas Yates |
| Website | https://www.nano.upenn.edu/resources/nanoscale-characterization/ |
About
The Nanoscale Characterization Facility (NCF) supports state-of-the-art tools for electron- and ion-beam analyses for Penn as well as other university, government, and industry users in the Philadelphia region. The facility comprises a suite of rooms specifically designed to host current and next-generation scanning electron, transmission electron, and focused ion beam microscopes. Supplementing these tools is an integrated sample preparation laboratory with sample coating and plasma cleaning capabilities, as well as cryogenic sample preparation equipment and a computer suite for offline image and data analysis. The NCF is currently maintained by three full-time staff scientists with over 45 years of combined experience in materials characterization.
Equipment
Go to NEMO: to request training and reserve equipment.