Difference between revisions of "Filmetrics F50 (UV Filter)"

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m (Changed protection level for "Filmetrics F50 (UV Filter)" ([Edit=Allow only autoconfirmed users] (indefinite) [Move=Allow only autoconfirmed users] (indefinite)))
(update tool owner, update to NEMO)
 
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| imagecaption =  
 
| imagecaption =  
 
| Instrument_Type = Metrology
 
| Instrument_Type = Metrology
| Staff_Manager = Sam Azadi
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| Staff_Manager = [[David Barth | David Barth]]
 
| Lab_Location = Bay 2
 
| Lab_Location = Bay 2
 
| Tool_Manufacturer = Filmetrics
 
| Tool_Manufacturer = Filmetrics
 
| Tool_Model = F50
 
| Tool_Model = F50
| Iris_Designation = MET-03
+
| NEMO_Designation = MET-03
 
| Lab_Phone = XXXXX
 
| Lab_Phone = XXXXX
 
| SOP Link = [https://repository.upenn.edu/scn_sop/15/ SOP]
 
| SOP Link = [https://repository.upenn.edu/scn_sop/15/ SOP]

Latest revision as of 14:19, 3 January 2024


Filmetrics F50 (UV Filter)
MET-03.jpeg
Tool Name Filmetrics F50 (UV Filter)
Instrument Type Metrology
Staff Manager David Barth
Lab Location Bay 2
Tool Manufacturer Filmetrics
Tool Model F50
NEMO Designation MET-03
Lab Phone XXXXX
SOP Link SOP

Description

The Filmetrics F50 family of products can map film thickness as quickly as two points per second. A motorized R-Theta stage accepts standard and custom chucks for samples up to 200mm in diameter. This system has a UV filter installed and is used for measuring film thicknesses of UV sensitive photoresists. A second F50 system without UV filters is located in the QNF (MET-11).

Map patterns can be polar, rectangular, or linear, or you can create your own with no limit on the number of measurement points. Dozens of pre-defined map patterns are supplied.

Applications
  • Thin-film thickness optical measurements


Resources

SOPs & Troubleshooting