Difference between revisions of "External Resources"
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Revision as of 12:34, 16 February 2024
Overview
This page includes useful reference texts and websites. It will be updated periodically. Contact Nicole Bohn if you have any recommendations.
Transmission Electron Microscopy
- Williams, David B. and C. Barry Carter. Transmission Electron Microscopy: A Textbook for Materials Science. Springer. (multiple eds.)
- Williams, David B. and C. Barry Carter (Eds). Transmission Electron Microscopy: Diffraction, Imaging, and Spectroscopy. Springer. (multiple eds.)
- Rodenburg, John. “Tutorials in Transmission Electron Microscopy.” Last modified October 2004, Rodenburg.org
Scanning Electron Microscopy
- Goldstein, Joseph., et al. Scanning Electron Microscopy and Microanalysis. Springer. (multiple eds.)
- Bohn, Nicole. “NCF EM Reference.” Last modified 2023, NCF EM Reference (our internal reference website, includes SOPs.)
Focused Ion Beam Microscopy
- Giannuzzi, Lucille A. and Fred A. Stevie (Eds). Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. Springer, 2005.
EDS and EBSD
- Goldstein, Joseph., et al. Scanning Electron Microscopy and Microanalysis. Springer.
- “Tips and Tricks.” EDAX.com, 2022. EDAX.com
- Introduction to EDS Analysis: Reference Manual. Bruker, 2011.