JEOL F200

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JEOL F200
F200.jpg
Tool Name F2
Instrument Type S/TEM
Staff Manager Douglas Yates
Lab Location 009
Tool Manufacturer JEOL
Tool Model JEM-F200
NEMO Designation JEOL F200 TEM-STEM
Lab Phone XXXXX
SOP Link NEMO login required

Description

The JEOL F200 is a 200kV scanning / transmission electron microscope with a cold field emission source and quad lens condenser system. It is designed to be user friendly and easy to operate while yielding stable, high resolution results.

Capabilities

The JEOL F200 includes two large area energy dispersive x-ray spectrometers and a pair of Gatan in-situ cameras, the OneView and recently added Metro. This microscope incorporates STEMx capability.

External Resources

For more information, check out the JEOL website.