Difference between revisions of "Icon AFM"
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| name = Icon AFM | | name = Icon AFM | ||
| Tool_Name = Icon AFM | | Tool_Name = Icon AFM | ||
| − | | image = [[Image: | + | | image = [[Image:Dimension-icon-atomic-force-microscope-bruker.png|300px]] |
| imagecaption = | | imagecaption = | ||
| Instrument_Type = AFM | | Instrument_Type = AFM | ||
Latest revision as of 17:36, 7 January 2025
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| Tool Name | Icon AFM |
|---|---|
| Instrument Type | AFM |
| Staff Manager | Matt Brukman |
| Lab Location | Room 019 |
| Tool Manufacturer | Bruker |
| Tool Model | Dimension Icon |
| NEMO Designation | Icon AFM |
| Lab Phone | 8-9457 |
| SOP Link | SOP |
Description
The Icon is an atomic force microscope with an 90μm in-plane scan range and 14μm vertical scan range that can operate in ambient atmosphere or fluid environment.
Applications
- Topographic imaging in contact and tapping (AC) modes
- Stiffness, friction, and adhesion measurements (Quantitative nanomechanics)
- Piezoelectric force microscopy
- Conductive AFM (Tuna mode)
- Scanning Kelvin Force (surface potential)
Accessories
- Scan-Assist mode
- Fluid tipholder
- Dual-gain TUNA module
- Torsion-mode tipholder
Resources