Difference between revisions of "Jandel Multi Height Four Point Probe"
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m (Protected "Jandel Multi Height Four Point Probe" ([Edit=Allow only administrators] (indefinite) [Move=Allow only administrators] (indefinite)) [cascading]) |
Revision as of 13:33, 29 April 2022
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| Tool Name | Jandel Multi Height Four Point Probe |
|---|---|
| Instrument Type | Electrical Characterization |
| Staff Manager | Sam Azadi |
| Lab Location | Bay 2 |
| Tool Manufacturer | Jandel |
| Tool Model | Four Point Probe |
| NEMO Designation | {{{NEMO_Designation}}} |
| Lab Phone | XXXXX |
| SOP Link | [ NA] |
Description
The system allows probing of wafers, ingots, or samples of widely varying dimensions. A locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height. A plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc. The system utilizes a Jandel Cylindrical probe head.
Applications
- Material resistivity measurements
Resources
SOPs & Troubleshooting
- [ NA]