Difference between revisions of "Jandel Multi Height Four Point Probe"

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Revision as of 12:34, 2 May 2022


Jandel Multi Height Four Point Probe
MET-08.jpeg
Tool Name Jandel Multi Height Four Point Probe
Instrument Type Electrical Characterization
Staff Manager Sam Azadi
Lab Location Bay 2
Tool Manufacturer Jandel
Tool Model Four Point Probe
NEMO Designation {{{NEMO_Designation}}}
Lab Phone XXXXX
SOP Link [ NA]

Description

The system allows probing of wafers, ingots, or samples of widely varying dimensions. A locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height. A plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc. The system utilizes a Jandel Cylindrical probe head.

Applications
  • Material resistivity measurements


Resources

SOPs & Troubleshooting
  • [ NA]
Retrieved from "https://wiki.nano.upenn.edu/wiki/index.php?title=Jandel_Multi_Height_Four_Point_Probe&oldid=470"