Difference between revisions of "KLA Tencor P7 2D profilometer"
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− | [[Category:Metrology]] | + | [[Category:Metrology]][[Category:Equipment]] |
{{EquipmentInfo | {{EquipmentInfo | ||
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| Instrument_Type = Metrology | | Instrument_Type = Metrology | ||
| Staff_Manager = [[David Barth | David Barth]] | | Staff_Manager = [[David Barth | David Barth]] | ||
− | | Lab_Location = | + | | Lab_Location = Cleanroom Corridor |
| Tool_Manufacturer = KLA | | Tool_Manufacturer = KLA | ||
| Tool_Model = P7 | | Tool_Model = P7 |
Latest revision as of 13:33, 28 July 2025
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Tool Name | KLA Tencor P7 2D profilometer |
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Instrument Type | Metrology |
Staff Manager | David Barth |
Lab Location | Cleanroom Corridor |
Tool Manufacturer | KLA |
Tool Model | P7 |
NEMO Designation | MET-01 |
Nearest Phone | XXXXX |
SOP Link | SOP |
Description
The KLA-Tencor P7 Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. The KLA-Tencor Profiler systems use stylus-based scanning to achieve high resolution.
Applications
- Film step height measurements
- Photo resist thickness
- Etched trench depth
- Materials characterization for surface roughness and waviness