Difference between revisions of "Filmetrics F40"
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m (Changed protection level for "Filmetrics F40" ([Edit=Allow only autoconfirmed users] (indefinite) [Move=Allow only autoconfirmed users] (indefinite))) |
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| Instrument_Type = Metrology | | Instrument_Type = Metrology | ||
| − | | Staff_Manager = | + | | Staff_Manager = [[David Barth | David Barth]] |
| − | | Lab_Location = | + | | Lab_Location = Cleanroom Corridor |
| Tool_Manufacturer = Filmetrics | | Tool_Manufacturer = Filmetrics | ||
| Tool_Model = F40 | | Tool_Model = F40 | ||
| − | | | + | | NEMO_Designation = MET-04 |
| Lab_Phone = XXXXX | | Lab_Phone = XXXXX | ||
| SOP Link = [https://repository.upenn.edu/scn_sop/14/ SOP] | | SOP Link = [https://repository.upenn.edu/scn_sop/14/ SOP] | ||
Latest revision as of 10:44, 28 June 2024
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| Tool Name | Filmetrics F40 |
|---|---|
| Instrument Type | Metrology |
| Staff Manager | David Barth |
| Lab Location | Cleanroom Corridor |
| Tool Manufacturer | Filmetrics |
| Tool Model | F40 |
| NEMO Designation | MET-04 |
| Lab Phone | XXXXX |
| SOP Link | SOP |
Description
The Filmetrics F40 is a microscope-mounted thin-film measurement system, allowing you to non-destructively measure thin-film thicknesses in small (patterned) areas on your sample. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films.
Applications
- Thin-film thickness optical measurements