Difference between revisions of "Filmetrics F40"

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(Created page with "Category:Metrology {{EquipmentInfo | name = Filmetrics F40 | Tool_Name = Filmetrics F40 | image = 300px | imagecaption = | Instrument_Type = Metrol...")
 
 
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| imagecaption =  
 
| imagecaption =  
 
| Instrument_Type = Metrology
 
| Instrument_Type = Metrology
| Staff_Manager = Sam Azadi
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| Staff_Manager = [[David Barth | David Barth]]
| Lab_Location = Bay 2
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| Lab_Location = Cleanroom Corridor
 
| Tool_Manufacturer = Filmetrics
 
| Tool_Manufacturer = Filmetrics
 
| Tool_Model = F40
 
| Tool_Model = F40
| Iris_Designation = MET-04
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| NEMO_Designation = MET-04
 
| Lab_Phone = XXXXX
 
| Lab_Phone = XXXXX
 
| SOP Link = [https://repository.upenn.edu/scn_sop/14/ SOP]
 
| SOP Link = [https://repository.upenn.edu/scn_sop/14/ SOP]
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== Description ==
 
== Description ==
The Filmetrics F40-UV is a microscope-mounted thin-film measurement system, allowing you to non-destructively measure thin-film thicknesses in small (patterned) areas on your sample. The microscope is a standard Olympus BHJML metallurgical trinocular microscope. It is an optical reflectometer, acquiring reflection spectra between 400-900nm optical wavelengths (Vis to Near-IR) with a regular halogen microscope light source. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films.
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The Filmetrics F40 is a microscope-mounted thin-film measurement system, allowing you to non-destructively measure thin-film thicknesses in small (patterned) areas on your sample. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films.
 
 
  
  

Latest revision as of 10:44, 28 June 2024


Filmetrics F40
MET-04.jpeg
Tool Name Filmetrics F40
Instrument Type Metrology
Staff Manager David Barth
Lab Location Cleanroom Corridor
Tool Manufacturer Filmetrics
Tool Model F40
NEMO Designation MET-04
Lab Phone XXXXX
SOP Link SOP

Description

The Filmetrics F40 is a microscope-mounted thin-film measurement system, allowing you to non-destructively measure thin-film thicknesses in small (patterned) areas on your sample. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films.


Applications
  • Thin-film thickness optical measurements


Resources

SOPs & Troubleshooting