Difference between revisions of "Transmission Electron Microscopy"
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Latest revision as of 11:28, 14 February 2024
Overview
Transmission Electron Microscopy (TEM) generates high resolution images or diffraction patterns via the transmission of a highly energetic electron beam through a thin specimen. It can reveal information about crystal structures, defects, elemental makeup, and more with the appropriate analytical techniques.
Equipment
Techniques
Key Principles
coming soon