Difference between revisions of "Sandvik Furnace Stack"

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(BYU has an excellent online calculator you can use to find out how much time your process would take for a given thickness and temperature. https://cleanroom.byu.edu/oxidetimecalc)
 
(12 intermediate revisions by 2 users not shown)
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| imagecaption =  
 
| imagecaption =  
 
| Instrument_Type = Deposition
 
| Instrument_Type = Deposition
| Staff_Manager = Sam Azadi
+
| Staff_Manager = [[Sam Azadi | Sam Azadi]]
 
| Lab_Location = Bay 2
 
| Lab_Location = Bay 2
 
| Tool_Manufacturer = Ultratech/Cambridge
 
| Tool_Manufacturer = Ultratech/Cambridge
 
| Tool_Model = S200
 
| Tool_Model = S200
| Iris_Designation = CVD-02
+
| NEMO_Designation = CVD-02
 
| Lab_Phone = 215-898-9736
 
| Lab_Phone = 215-898-9736
 
| SOP Link = [https://repository.upenn.edu/scn_sop/20/ SOP]
 
| SOP Link = [https://repository.upenn.edu/scn_sop/20/ SOP]
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== Description ==
 
== Description ==
The Sandvik LPCVD consists of 4 furnace tubes:  
+
The Sandvik LPCVD consists of 4 furnace tubes, with maximum temperature of 1050 C for each one:  
  
'''Tube 1:''' Wet/Dry Silicon Oxide deposition.  
+
'''Tube 1:''' Wet/Dry Silicon Oxide growth.  
 
Wet/Dry oxide: This tube uses the Si substrate to grow SiO2. Wet oxide refers to the use
 
Wet/Dry oxide: This tube uses the Si substrate to grow SiO2. Wet oxide refers to the use
 
of water vapor as the source of oxygen and dry oxide uses O2 gas. Since water molecules can
 
of water vapor as the source of oxygen and dry oxide uses O2 gas. Since water molecules can
 
penetrate through the substrate more, wet oxide technique results in thicker oxides and faster
 
penetrate through the substrate more, wet oxide technique results in thicker oxides and faster
 
growth rate. Wet oxide deposition on the tool is limited to 5 hours.
 
growth rate. Wet oxide deposition on the tool is limited to 5 hours.
 +
BYU has an excellent online calculator you can use to find out how much time your process would take for a given thickness and temperature.
 +
https://cleanroom.byu.edu/oxidetimecalc
  
 
'''Tube 2:''' Low Stress Silicon Nitride deposition.  
 
'''Tube 2:''' Low Stress Silicon Nitride deposition.  
Line 35: Line 37:
  
 
===== Applications =====
 
===== Applications =====
* Wet/Dry Silicon Oxide deposition
+
* Wet/Dry Silicon Oxide growth
 
* Low Stress Silicon Nitride deposition
 
* Low Stress Silicon Nitride deposition
 
* Annealing with N2 or H2N2 gases
 
* Annealing with N2 or H2N2 gases
 
 
===== Process data =====
 
* SiN<sub>x</sub> deposition rate of the standard recipe on the tool is ~ 490 nm/hour with thin film stress of ~ 60 MPa for a 1-hour run. The films deposited
 
via, LPCVD have a higher resistance towards CF4 etch and make better etch masks. In an RIE
 
system with CF4 etch, LPCVD silicon nitride is etched at the rate of 50 nm/min vs 80 nm/min for
 
PECVD silicon nitride. The etch rate for LPCVD silicon nitride film in 49% HF at room temperature
 
is ~ 2.5 nm/min.
 
  
 
== Resources ==
 
== Resources ==
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===== SOPs & Troubleshooting =====
 
===== SOPs & Troubleshooting =====
 
* [https://repository.upenn.edu/scn_sop/20/ QNF SOP]
 
* [https://repository.upenn.edu/scn_sop/20/ QNF SOP]
 +
 +
==== Process information ====
 +
* [https://repository.upenn.edu/scn_protocols/74/ Deposition and Etch Characterization of LPCVD SiNx]
 +
 +
==== Deposition and growth rate ====
 +
* Thermal Oxide growth rate is not constant. Please use online calculators to get an estimate
 +
*** BYU has an excellent online calculator you can use to find out how much time your process would take for a given thickness and temperature.
 +
https://cleanroom.byu.edu/oxidetimecalc
 +
* LPCVD nitride deposition rate using the standard recipe: ~ 480 nm/hour

Latest revision as of 09:11, 29 January 2024


Sandvik Furnace Stack
CVD-02.jpeg
Tool Name Sandvik Furnace Stack
Instrument Type Deposition
Staff Manager Sam Azadi
Lab Location Bay 2
Tool Manufacturer Ultratech/Cambridge
Tool Model S200
NEMO Designation CVD-02
Lab Phone 215-898-9736
SOP Link SOP

Description

The Sandvik LPCVD consists of 4 furnace tubes, with maximum temperature of 1050 C for each one:

Tube 1: Wet/Dry Silicon Oxide growth. Wet/Dry oxide: This tube uses the Si substrate to grow SiO2. Wet oxide refers to the use of water vapor as the source of oxygen and dry oxide uses O2 gas. Since water molecules can penetrate through the substrate more, wet oxide technique results in thicker oxides and faster growth rate. Wet oxide deposition on the tool is limited to 5 hours. BYU has an excellent online calculator you can use to find out how much time your process would take for a given thickness and temperature. https://cleanroom.byu.edu/oxidetimecalc

Tube 2: Low Stress Silicon Nitride deposition. This tube is designated to low stress silicon nitride.

Tube 3: Clean anneal. This tube is an RCA clean wafer only anneal tube, with N2 and H2N2 gases.

Tube 4: General anneal. This tube is a general anneal tube, with N2 and H2N2 gases

Applications
  • Wet/Dry Silicon Oxide growth
  • Low Stress Silicon Nitride deposition
  • Annealing with N2 or H2N2 gases

Resources

SOPs & Troubleshooting

Process information

Deposition and growth rate

  • Thermal Oxide growth rate is not constant. Please use online calculators to get an estimate
      • BYU has an excellent online calculator you can use to find out how much time your process would take for a given thickness and temperature.

https://cleanroom.byu.edu/oxidetimecalc

  • LPCVD nitride deposition rate using the standard recipe: ~ 480 nm/hour