Jandel Multi Height Four Point Probe

Jandel Multi Height Four Point Probe

Tool Name	Jandel Multi Height Four Point Probe
Instrument Type	Metrology
Staff Manager	Sam Azadi
Lab Location	Bay 2
Tool Manufacturer	Jandel
Tool Model	Four Point Probe
NEMO Designation	{{{NEMO_Designation}}}
Lab Phone	XXXXX
SOP Link	[ NA]

Description

The system allows probing of wafers, ingots, or samples of widely varying dimensions. A locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height. A plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc. The system utilizes a Jandel Cylindrical probe head.

Applications

• Material resistivity measurements

Resources

SOPs & Troubleshooting

• [ NA]