Difference between revisions of "Icon AFM"
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(Created page with "Category:Ambient AFM {{EquipmentInfo | name = Icon AFM | Tool_Name = Icon AFM | image = 300px | imagecaption = | Instrument_Type = AFM | Staff_Mana...") |
(update to NEMO) |
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| Line 11: | Line 11: | ||
| Tool_Manufacturer = Bruker | | Tool_Manufacturer = Bruker | ||
| Tool_Model = Dimension Icon | | Tool_Model = Dimension Icon | ||
| − | | | + | | NEMO_Designation = Icon AFM |
| Lab_Phone = 8-9457 | | Lab_Phone = 8-9457 | ||
| SOP Link = [https://upenn.box.com/s/pg7z3r84b6jccfxhf25a6aiicc99xotg SOP] | | SOP Link = [https://upenn.box.com/s/pg7z3r84b6jccfxhf25a6aiicc99xotg SOP] | ||
Latest revision as of 14:25, 3 January 2024
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| Tool Name | Icon AFM |
|---|---|
| Instrument Type | AFM |
| Staff Manager | Matt Brukman |
| Lab Location | Room 019 |
| Tool Manufacturer | Bruker |
| Tool Model | Dimension Icon |
| NEMO Designation | Icon AFM |
| Lab Phone | 8-9457 |
| SOP Link | SOP |
Description
The Icon is an atomic force microscope with an 90μm in-plane scan range and 14μm vertical scan range that can operate in ambient atmosphere or fluid environment.
Applications
- Topographic imaging in contact and tapping (AC) modes
- Stiffness, friction, and adhesion measurements (Quantitative nanomechanics)
- Piezoelectric force microscopy
- Conductive AFM (Tuna mode)
- Scanning Kelvin Force (surface potential)
Accessories
- Scan-Assist mode
- Fluid tipholder
- Dual-gain TUNA module
- Torsion-mode tipholder
Resources