Scanning & Local Probe Facility
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| Corridor view of the SLPF suite | |
| Home Institution | University of Pennsylvania |
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| Location | Philadelphia, PA |
| Building | Krishna P. Singh Center for Nanotechnology |
| Established | 2013 |
| Director | Matthew Brukman |
| Website | https://www.nano.upenn.edu/ |
About the Scanning & Local Probe Facility
The Scanning and Local Probe Facility at the Singh Center is a user facility offering topographical, mechanical, electrical, optical, and chemical characterization tools in ambient, fluid, and high vacuum environments.
Access
Instructions for gaining access to the Scanning and Local Probe Facility can be found here.
After establishing an account, go to NEMO Help for information on getting started.
Contact Matt Brukman to discuss your project needs.
Available Resources
The facility is equipped with 2 ambient atomic force microscopes, two scanning confocal Raman spectroscopes (with AFM accessories), an ultra-high vacuum AFM+scanning tunneling microscope, an electronic probe station, and a total internal reflection fluorescence microscope with bio-AFM.
- Equipment : Find resources for any given instrument (e.g. SOPs, troubleshooting, presentations, manuals, videos, specifications)
- Equipment Reservations: Go to the SLPF's Nemo site to make reservations to use the equipment
- Suggestion Box: Please send all SUGGESTIONS to help improve the Scanning Probe Lab to Matt Brukman.