Icon AFM
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| Tool Name | Icon AFM |
|---|---|
| Instrument Type | AFM |
| Staff Manager | Matt Brukman |
| Lab Location | Room 019 |
| Tool Manufacturer | Bruker |
| Tool Model | Dimension Icon |
| NEMO Designation | {{{NEMO_Designation}}} |
| Lab Phone | 8-9457 |
| SOP Link | SOP |
Description
The Icon is an atomic force microscope with an 90μm in-plane scan range and 14μm vertical scan range that can operate in ambient atmosphere or fluid environment.
Applications
- Topographic imaging in contact and tapping (AC) modes
- Stiffness, friction, and adhesion measurements (Quantitative nanomechanics)
- Piezoelectric force microscopy
- Conductive AFM (Tuna mode)
- Scanning Kelvin Force (surface potential)
Accessories
- Scan-Assist mode
- Fluid tipholder
- Dual-gain TUNA module
- Torsion-mode tipholder
Resources