Total Internal Reflection Fluorescence AFM

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TIRF-AFM
EBL-01.jpeg
Tool Name TIRF-AFM
Instrument Type AFM
Staff Manager Matt Brukman
Lab Location Room 014
Tool Manufacturer Asylum / Nikon
Tool Model MFP-3D
NEMO Designation {{{NEMO_Designation}}}
Lab Phone 8-9457
SOP Link SOP

Description

The TIRF-AFM is an atomic force microscope with an 80μm in-plane scan range and 13μm vertical scan range that can operate in ambient atmosphere or fluid environment installed on an inverted optical microscope with total internal reflection optics and three laser lines of illumination. Its dedicated prep lab has a CO2 incubator and bio safety cabinet for sample storage and plating.

Applications
  • Fluorescent imaging of cells, proteins, tissues, and nanoparticles
  • Nano-injection of drugs and dyes
  • Topographic imaging in contact and tapping (AC) modes
  • Stiffness, friction, and adhesion measurements
  • Piezoelectric force microscopy
  • Conductive AFM (ORCA mode)
  • Scanning Kelvin Force (surface potential)

Accessories

  • Micromanipulator + nanoinjector system
  • Photometrics Prime 95B camera
  • Nikon Eclipse Ti inverted optical microscope
  • 633, 532, and 488 nm laser sources
  • Dual-gain ORCA tipholder
  • High-voltage PFM tipholder
  • Polymer heater sample holder
  • Humidity-sensing sample holder
  • Fluid heater sample holder (shared with TIRF-AFM)


Resources

SOPs & Troubleshooting