Difference between revisions of "Filmetrics F40"

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(Created page with "Category:Metrology {{EquipmentInfo | name = Filmetrics F40 | Tool_Name = Filmetrics F40 | image = 300px | imagecaption = | Instrument_Type = Metrol...")
 
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== Description ==
 
== Description ==
The Filmetrics F40-UV is a microscope-mounted thin-film measurement system, allowing you to non-destructively measure thin-film thicknesses in small (patterned) areas on your sample. The microscope is a standard Olympus BHJML metallurgical trinocular microscope. It is an optical reflectometer, acquiring reflection spectra between 400-900nm optical wavelengths (Vis to Near-IR) with a regular halogen microscope light source. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films.
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The Filmetrics F40 is a microscope-mounted thin-film measurement system, allowing you to non-destructively measure thin-film thicknesses in small (patterned) areas on your sample. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films.
 
 
  
  

Revision as of 08:01, 30 March 2022


Filmetrics F40
MET-04.jpeg
Tool Name Filmetrics F40
Instrument Type Metrology
Staff Manager Sam Azadi
Lab Location Bay 2
Tool Manufacturer Filmetrics
Tool Model F40
NEMO Designation {{{NEMO_Designation}}}
Lab Phone XXXXX
SOP Link SOP

Description

The Filmetrics F40 is a microscope-mounted thin-film measurement system, allowing you to non-destructively measure thin-film thicknesses in small (patterned) areas on your sample. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films.


Applications
  • Thin-film thickness optical measurements


Resources

SOPs & Troubleshooting