Difference between revisions of "KLA Tencor P7 2D profilometer"

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== Description ==
 
== Description ==
The QNF Savannah ALD is equipped with high-speed pneumatic pulse valves to enable our unique Exposure Mode™ for thin film deposition on ultra high aspect ratio substrates. This proven precision thin film coating methodology can be used to deposit conformal, uniform films on substrates with aspect ratios of greater than > 2000:1.
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The KLA-Tencor P7 Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. The KLA-Tencor Profiler systems use stylus-based scanning to achieve high resolution.
 
 
The QNF Savannah ALD is capable of holding substrates of different sizes (up to 200mm). The system is equipped with six precursor lines for deposition of Al2O3, HfO2, TiO2, and SiO2.
 
  
 
===== Applications =====
 
===== Applications =====
* Aluminum oxide deposition
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* Film step height measurements
* Silicon dioxide deposition
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* Photo resist thickness
* Titanium oxide deposition
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* Etched trench depth
* Hafnium oxide deposition
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* Materials characterization for surface roughness and waviness
* Deposition of other films can be made available upon request
 
  
  

Revision as of 15:41, 29 March 2022


KLA Tencor P7 2D profilometer
MET-01.jpeg
Tool Name KLA Tencor P7 2D profilometer
Instrument Type Metrology
Staff Manager Sam Azadi
Lab Location Bay 2
Tool Manufacturer KLA
Tool Model P7
NEMO Designation {{{NEMO_Designation}}}
Lab Phone XXXXX
SOP Link SOP

Description

The KLA-Tencor P7 Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. The KLA-Tencor Profiler systems use stylus-based scanning to achieve high resolution.

Applications
  • Film step height measurements
  • Photo resist thickness
  • Etched trench depth
  • Materials characterization for surface roughness and waviness


Resources

SOPs & Troubleshooting