Difference between revisions of "JEOL 7500F HRSEM"
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== Accessories == | == Accessories == | ||
Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a [[STEM | scanning-transmission electron detector]] shows the internal structure of materials. Through a stage biasing system, referred to as the [[Low Voltage SEM | “gentle-beam” mode]], the electron beam interacting with the sample may be reduced to a fraction of the accelerating voltage of the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating. An [[EDS | EDAX Energy Dispersive x-ray spectrometer (EDS)]] is available for chemical characterization via spectra or element maps. | Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a [[STEM | scanning-transmission electron detector]] shows the internal structure of materials. Through a stage biasing system, referred to as the [[Low Voltage SEM | “gentle-beam” mode]], the electron beam interacting with the sample may be reduced to a fraction of the accelerating voltage of the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating. An [[EDS | EDAX Energy Dispersive x-ray spectrometer (EDS)]] is available for chemical characterization via spectra or element maps. | ||
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| + | == Sample Holders == | ||
| + | Compatible sample holders are required when loading specimens into the 7500F, and the appropriate holder must be selected after loading the specimen onto the stage. A guide for holder icon selection is available on our [https://sites.google.com/seas.upenn.edu/ncf-em-reference/sample-holders reference website] | ||
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| + | == EDS with APEX == | ||
| + | APEX by EDAX is installed on the companion computer for [[EDS]] data collection and analysis. A guide for this program is available on our [https://sites.google.com/seas.upenn.edu/ncf-em-reference/7500f/eds-apex reference website.] | ||
Latest revision as of 15:16, 14 June 2024
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| Tool Name | 7500F |
|---|---|
| Instrument Type | SEM |
| Staff Manager | Jamie Ford, Nicole Bohn |
| Lab Location | Bay 6 |
| Tool Manufacturer | JEOL, Inc. |
| Tool Model | 7500F HRSEM |
| NEMO Designation | JEOL 7500F HRSEM |
| Lab Phone | XXXXX |
| SOP Link | 7500F Reference Guide |
Description
The JEOL 7500F Scanning Electron Microscope provides ultrahigh resolution of 0.8 nm at 30 kV and 1 nm at 1 kV, which is particularly useful for soft-matter studies. The JEOL 7500F SEM is our dedicated conventional and high-resolution imaging microscope.
Accessories
Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a scanning-transmission electron detector shows the internal structure of materials. Through a stage biasing system, referred to as the “gentle-beam” mode, the electron beam interacting with the sample may be reduced to a fraction of the accelerating voltage of the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating. An EDAX Energy Dispersive x-ray spectrometer (EDS) is available for chemical characterization via spectra or element maps.
Sample Holders
Compatible sample holders are required when loading specimens into the 7500F, and the appropriate holder must be selected after loading the specimen onto the stage. A guide for holder icon selection is available on our reference website
EDS with APEX
APEX by EDAX is installed on the companion computer for EDS data collection and analysis. A guide for this program is available on our reference website.