View source for Zeiss Axio Imager M2m Microscopes

[[Category:Metrology]]

{{EquipmentInfo
| name = Zeiss Axio Imager M2m Microscopes
| Tool_Name = Zeiss Axio Imager M2m Microscopes
| image = [[Image:MET-12.jpeg|300px]]
| imagecaption = 
| Instrument_Type = Metrology
| Staff_Manager = [[Kyle Keenan | Kyle Keenan]]
| Lab_Location = Cleanroom Corridor
| Tool_Manufacturer = Zeiss
| Tool_Model = Axio Imager M2m 
| NEMO_Designation = MET-12, MET-13, MET-14, MET-15
| Lab_Phone = XXXXX
| SOP Link = [https://www.seas.upenn.edu/~nanosop/Zeiss_Image_M2m.htm SOP]
}}

== Description ==
In Normal operation, it is possible to observe ~2 µm diameter objects in the reflected and transmitted mode. Furthermore, the following contrasting techniques are available: bright-field, dark-field, Circular Differential Interference Contrast (C-DIC) using circularly polarized light, polarization contrast, and polarization with additional retarder. The image snapped can be analyzed using the annotation tool on
the software.

In Extended Focus operation, the images of 3D structure can be acquired at different focus positions, and automatically combined as a sharp 2D image.

In Panorama operation, the images acquired can be stitched, so that the optical microscope image of the wide object can be obtained.

===== Applications =====
* Bright-field Imaging
* Dark-field Imaging 
* Circular Differential Interference Contrast (C-DIC) Imaging
* Polarization contrast Imaging


== Resources ==

===== SOPs & Troubleshooting =====
* [https://www.seas.upenn.edu/~nanosop/Zeiss_Image_M2m.htm QNF SOP]