View source for JEOL 7500F HRSEM

[[Category:Characterization]]

{{EquipmentInfo
| name = JEOL 7500F HRSEM
| Tool_Name = 7500F
| image = [[File:7500f.jpg|300px]]
| imagecaption = 
| Instrument_Type = SEM
| Staff_Manager = Jamie Ford, Nicole Bohn
| Lab_Location = Bay 6
| Tool_Manufacturer = JEOL, Inc.
| Tool_Model = 7500F HRSEM
| NEMO_Designation = JEOL 7500F HRSEM
| Lab_Phone = XXXXX
| SOP Link = [https://sites.google.com/seas.upenn.edu/ncf-em-reference/7500f 7500F Reference Guide ]
}}

== Description ==
The JEOL 7500F Scanning Electron Microscope provides ultrahigh resolution of 0.8 nm at 30 kV and 1 nm at 1 kV, which is particularly useful for soft-matter studies. The JEOL 7500F SEM is our dedicated conventional and high-resolution imaging microscope. 

== Accessories ==
Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a [[STEM | scanning-transmission electron detector]] shows the internal structure of materials. Through a stage biasing system, referred to as the [[Low Voltage SEM | “gentle-beam” mode]], the electron beam interacting with the sample may be reduced to a fraction of the accelerating voltage of the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating. An [[EDS | EDAX Energy Dispersive x-ray spectrometer (EDS)]] is available for chemical characterization via spectra or element maps.

== Sample Holders ==
Compatible sample holders are required when loading specimens into the 7500F, and the appropriate holder must be selected after loading the specimen onto the stage. A guide for holder icon selection is available on our [https://sites.google.com/seas.upenn.edu/ncf-em-reference/sample-holders reference website]

== EDS with APEX ==
APEX by EDAX is installed on the companion computer for [[EDS]] data collection and analysis. A guide for this program is available on our [https://sites.google.com/seas.upenn.edu/ncf-em-reference/7500f/eds-apex reference website.]