Scanning & Local Probe Facility
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| Corridor view of the SLPF suite | |
| Home Institution | University of Pennsylvania |
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| Location | Philadelphia, PA |
| Building | Krishna P. Singh Center for Nanotechnology |
| Established | 2013 |
| Director | Matthew Brukman |
| Website | https://www.nano.upenn.edu/ |
About the Scanning & Local Probe Facility
The Scanning and Local Probe Facility at the Singh Center is a user facility offering topographical, mechanical, electrical, optical, and chemical characterization tools in ambient, fluid, and high vacuum environments.
Available Resources
The facility is equipped with 2 ambient atomic force microscopes, two scanning confocal Raman spectroscopes (with AFM accessories), an ultra-high vacuum AFM+scanning tunneling microscope, an electronic probe station, and a total internal reflection fluorescence microscope with bio-AFM.
- Equipment : Find resources for any given instrument (e.g. SOPs, troubleshooting, presentations, manuals, videos, specifications)
- Equipment Reservations: Go to the SLPF's Nemo site to make reservations to use the equipment
- Suggestion Box: Please send all SUGGESTIONS to help improve the Scanning Probe Lab to Matt Brukman.