Difference between revisions of "Filmetrics F40"
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Revision as of 09:00, 30 March 2022
Tool Name | Filmetrics F40 |
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Instrument Type | Metrology |
Staff Manager | Sam Azadi |
Lab Location | Bay 2 |
Tool Manufacturer | Filmetrics |
Tool Model | F40 |
NEMO Designation | {{{NEMO_Designation}}} |
Lab Phone | XXXXX |
SOP Link | SOP |
Description
The Filmetrics F40-UV is a microscope-mounted thin-film measurement system, allowing you to non-destructively measure thin-film thicknesses in small (patterned) areas on your sample. The microscope is a standard Olympus BHJML metallurgical trinocular microscope. It is an optical reflectometer, acquiring reflection spectra between 400-900nm optical wavelengths (Vis to Near-IR) with a regular halogen microscope light source. The Filmetrics software then performs curve-fitting to determine the thickness and/or refractive index of the measured films.
Applications
- Thin-film thickness optical measurements